2007-01-1594 A Quantitative Study for Critical Factors of Automotive Battery Durability

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Park, C. H. / Yoon, J. H. / Choi, J. D. / Society of Automotive Engineers

Title :

Contributors:

Park, C. H. (author) / Yoon, J. H. (author) / Choi, J. D. (author) / Society of Automotive Engineers

Conference:

Sessions, Automotive electronics and systems reliability ; 2007 ; Detroit, MI

Published in:

SAE SP ; 2088

Publication date :

2007-01-01

Size :

6 pages

Remarks:

Held as part of the SAE 2007 world congress. Paper numbers 2007-01-1589 to 2007-01-1595 held.

Type of media :

Conference paper

Type of material :

Language :

English

Keywords :

Automotive electronics , Systems reliability

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