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    Using independent component analysis for electrical impedance tomography [5298-55]

    Using independent component analysis for electrical impedance tomography [5298-55]


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    Title :

    Using independent component analysis for electrical impedance tomography [5298-55]

    Contributors:
    Yan, P. (author) / Mo, Y. (author) / Dougherty, Edward R. / Astola, Jaakko T. / Egiazarian, Karen O. / Society for Imaging Science and Technology / IS & T--the Society for Imaging Science and Technology
    Conference:

    Conference; 3rd, Image processing: algorithms and systems ; 2004 ; San Jose, CA

    Published in:

    Image processing: algorithms and systems ; 447-454

    PROCEEDINGS- SPIE THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING ; 5298

    Publication date :

    2004-01-01

    Size :

    8 pages

    Remarks:

    Held as part of the Electronic imaging, science and technology symposium. Includes bibliographical references and index.

    ISBN :

    0819452017

    ISSN :

    0277-786X

    Type of media :

    Conference paper

    Type of material :

    Print

    Language :

    English

    Keywords :

    Image processing , Algorithms , electronic imaging , SPIE , IS&T

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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