Pattern Alignment Method Based on Consistency Among Local Registration Candidates for LSI Wafer Pattern Inspection

You are here: Homepage > Search

Pattern Alignment Method Based on Consistency Among Local Registration Candidates for LSI Wafer Pattern Inspection

Hiroi, T. / Shishido, C. / Watanabe, M. / Institute of Electrical and Electronics Engineers

Access

Access via TIB

Check availability in my library

Order at Subito €

Export, share and cite

Document information

Title :

Pattern Alignment Method Based on Consistency Among Local Registration Candidates for LSI Wafer Pattern Inspection

Contributors:

Hiroi, T. (author) / Shishido, C. (author) / Watanabe, M. (author) / Institute of Electrical and Electronics Engineers

Conference:

6th, Workshop on applications of computer vision ; 2002 ; Orlando, FL

Published in:

Workshop on applications of computer vision ; 257-263

WACV -PROCEEDINGS-

Publication date :

2002-01-01

Size :

7 pages

Remarks:

Also known as WACV 2002

ISBN :

0769518583

Type of media :

Conference paper

Type of material :

Language :

English

Keywords :

computer vision , WACV , IEEE

Hiroi, T. / Shishido, C. / Watanabe, M. | IEEE | 2002

LOCAL DRIVER PATTERN BASED NOTIFICATIONS

WERNER JOHN S / DUALE ALI Y / GOMES LOUIS P et al. | European Patent Office | 2019

Free access

LASER ALIGNMENT OF HEADLAMP BEAM PATTERN

HELWIG STEPHEN KENNETH / BROWN DAVID A / CURWOOD SIMON HOWARD et al. | European Patent Office | 2018

Free access

Image registration with global and local luminance alignment

Jiaya Jia, / Chi-Keung Tang, | IEEE | 2003

Feature Alignment Techniques for Pattern Recognition

Kosir, P. / DeWall, R. / Mitchell, R. et al. | British Library Conference Proceedings | 1994

Access

Access via TIB

Check availability in my library

Order at Subito €

Page navigation

Document information

Similar titles