Wide aperture interferometric spindle metrology: sensitivities and strategies

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Wide aperture interferometric spindle metrology: sensitivities and strategies

Wide aperture interferometric spindle metrology: sensitivities and strategies

Idowu, A. / Gee, A. E. / Institute of Physics

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Title :

Wide aperture interferometric spindle metrology: sensitivities and strategies

Contributors:

Idowu, A. (author) / Gee, A. E. (author) / Grattan, K. T. V. / Institute of Physics

Conference:

Divisional conference; 4th, Applied optics: Applied optics and optoelectronics 1996 ; 1996 ; Reading

Published in:

Applied optics: Applied optics and optoelectronics 1996 ; 182-187

APPLIED OPTICS AND OPTOELECTRONICS

Publication date :

1996-01-01

Size :

6 pages

ISBN :

Type of media :

Conference paper

Type of material :

Print

Language :

English

Keywords :

applied optics , optoelectronics

© Metadata Copyright the British Library Board and other contributors. All rights reserved.

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