Limitations of Markov Random Fields as Models of Textured Images of Real Surfaces

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Limitations of Markov Random Fields as Models of Textured Images of Real Surfaces

Speis, A. / Healey, G. / IEEE Computer Society / Technical Committee on Pattern Analysis and Machine Intelligence

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Title :

Limitations of Markov Random Fields as Models of Textured Images of Real Surfaces

Contributors:

Speis, A. (author) / Healey, G. (author) / IEEE Computer Society / Technical Committee on Pattern Analysis and Machine Intelligence

Conference:

5th International conference, Computer vision ; 1995 ; Cambridge; MA

Published in:

Computer vision ; 115-120

INTERNATIONAL CONFERENCE ON COMPUTER VISION

Publication date :

1995-01-01

Size :

6 pages

Remarks:

Also known as ICCV '95. IEEE Cat no 95CB35744

ISBN :

0818670428

Type of media :

Conference paper

Type of material :

Language :

English

Keywords :

computer vision , IEEE , ICCV , pattern analysis , machine intelligence

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