X-Rays Image Analysis for Defects Detection and Characterization in Metallic Samples
X-Rays Image Analysis for Defects Detection and Characterization in Metallic Samples
- New search for: Dinten, J.-M.
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- New search for: IEEE; Signal Processing Society
- New search for: Dinten, J.-M.
- New search for: Dziopa, P.
- New search for: Koenig, A.
- New search for: IEEE; Signal Processing Society
Document information
X-Rays Image Analysis for Defects Detection and Characterization in Metallic Samples
1st International conference on image processing, ICIP'94 ; 1994 ; Austin; TX
1994-01-01
5 pages
In 3 vols; IEEE Cat no 94CH35708
Conference paper
English
ICIP , image processing , IEEE
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