Synonyme wurden verwendet für: electronics reliability
Suche ohne Synonyme: keywords:(electronics reliability)

41–50 von 430 Ergebnissen
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    NASA EEE Parts and NASA Electronic Parts and Packaging (NEPP) Program Update 2018

    LaBel, Kenneth A. / Sampson, Michael J. / Pellish, Jonathan A. et al. | NTRS | 2018
    Schlagwörter: Quality Assurance And Reliability , Electronics And Electrical Engineering

    DIAGNOSTIC METHODS OF THE STATE OF EMBEDDED CONTROL SYSTEMS AND ADJACENT EQUIPMENT ON EXAMPLE OF A SHIP-BOARD EQUIPMENT

    Freier Zugriff
    Yu. I. Solovyov / V. Yu. Salnikov | DOAJ | 2018
    Schlagwörter: reliability , Electronics

    Affordable and Safe High Performance Vehicle Computers with Ultra-Fast On-Board Ethernet for Automated Driving

    Hager, Martin / Gromala, Przemyslaw / Wunderle, Bernhard et al. | Springer Verlag | 2018
    Schlagwörter: Reliability , Automotive electronics

    Inclusion of Radiation Effects in the NASA Reliability & Maintainability Standard

    R A Austin / B D Sierawski / J M Trippe et al. | NTRS | 2017
    Schlagwörter: Quality Assurance And Reliability , Electronics And Electrical Engineering

    Impact of distributed power electronics on the lifetime and reliability of PV systems

    Olalla, Carlos | Online Contents | 2017
    Schlagwörter: Reliability analysis , Electronics , Reliability aspects , distributed power electronics , reliability

    IMPROVING THE VALUE OF PRODUCTS OF MICROSYSTEM TECHNOLOGY

    Freier Zugriff
    A. A. G. Varzhapetyan / N. N. Ivanov / E. G. Semenova et al. | DOAJ | 2017
    Schlagwörter: reliability , Electronics

    Field Programmable Gate Array Reliability Analysis Guidelines for Launch Vehicle Reliability Block Diagram

    Al Hassan, Mohammad / Britton, Paul / Novack. Steven et al. | NTRS | 2017
    Schlagwörter: Quality Assurance And Reliability , Electronics And Electrical Engineering

    NASA Electronic Parts and Packaging (NEPP) Program, Discussion of Highly Accelerated Life Testing (HALT) of Capacitors

    K. A. LaBel / M. J. Sampson | NTIS | 2017
    Schlagwörter: Chips (electronics) , Reliability analysis

    Smart Features Integrated for Prognostics Health Management Assure the Functional Safety of the Electronics Systems at the High Level Required in Fully Automated Vehicles

    Rzepka, Sven / Gromala, Przemyslaw J. | Springer Verlag | 2017
    Schlagwörter: Reliability , Automotive electronics

    NEPP Program Task 17-294 Government Working Group

    Mcmanus, Patrick / Laird, Kathy / Sampson, Michael | NTRS | 2017
    Schlagwörter: Electronics And Electrical Engineering , Quality Assurance and Reliability - Government Working Group