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    Electronic speckle pattern shearing interferometry (ESPSI) and its application [2321-215]

    Electronic speckle pattern shearing interferometry (ESPSI) and its application [2321-215]


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    Titel :

    Electronic speckle pattern shearing interferometry (ESPSI) and its application [2321-215]

    Beteiligte:
    Steinchen, W. (Autor:in) / Yang, L. X. (Autor:in) / Schuth, M. (Autor:in) / Kupfer, G. (Autor:in) / Wang, D.-H. / Consortini, A. / Breckinridge, J. B. / Chinese Optical Society; Topical Committee on Optoelectronic Technology / SPIE- The International Society for Optical Engineering
    Kongress:

    2nd International conference, Optoelectronic science and engineering '94 ; 1994 ; Beijing

    Erschienen in:

    Optoelectronic science and engineering '94 ; 2321 ; 249-253

    PROCEEDINGS- SPIE THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING ; 2321

    Erscheinungsdatum :

    1994-01-01

    Format / Umfang :

    5 pages

    Anmerkungen:

    Also known as ICOESE '94

    ISBN :

    0819416525

    ISSN :

    0361-0748

    Medientyp :

    Aufsatz (Konferenz)

    Format :

    Print

    Sprache :

    Englisch

    Schlagwörter :

    optoelectronic science , ICOESE , optoelectronic engineering , SPIE

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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