Modified in-plane electronic speckle pattern shearing interferometry (ESPSI) [2860-28]
Conference; 8th, Laser interferometry VIII: techniques and analysis ; 1996 ; Denver; CO
1996-01-01
7 pages
See also same shelfmark vol 2861 1996 for further papers
Aufsatz (Konferenz)
Englisch
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Source modulation for phase shifting in static and dynamic speckle shearing interferometry [2860-30]
British Library Conference Proceedings | 1996
|Investigation of speckle displacement effects on speckle interferometry [2860-47]
British Library Conference Proceedings | 1996
|Double shear speckle interferometry for curvature measurement [2860-21]
British Library Conference Proceedings | 1996
|Optoelectronic developments in speckle interferometry (Invited Paper) [2860-22]
British Library Conference Proceedings | 1996
|British Library Conference Proceedings | 1996
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