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IEEE Applications Society, 10th IAS Annual Meeting, Hyatt Regency Atlanta, 28. Sept. - 2. Oct., 1975
Electronic Warfare: Military needs propel mini-RPVs into tactical flight tests
The VMOS power device - A direct interface between microprocessors
The easy way to get aerospace quality semiconductors
A lightweight 8-14 micrometer thermal imager
Definition of driver information instrumentation feature
Reliability assurance for optical semiconductor devices
Strain depending reliability of automotive diodes
Advanced IGBT modules for railway traction applications: Reliability testing
On-chip reliability investigations on power modules actually working in inverter systems
The past, present and future of EEE components for space application; COTS-the next generation
The effects of cyclic thermal loading on n-type 4H-SiC device components for EM-gun pulsers
Reliability engineering-an integrated approach at Daimler Chrysler
Long term reliability testing of HV-IGBT modules in worst case traction operation
Fabrication, packaging, and performance of VCSELs and photodetectors for space applications
Reliability of thick Al wire bonds in IGBT modules for traction motor drives