1–4 von 4 Ergebnissen
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    Characterization of 850nm AlGaAs/GaAs implant vertical cavity emitting lasers utilizing silicon implantation induced disordering

    Kuo, H. C. / Shu, W. C. / Lu, T. C. et al. | British Library Conference Proceedings | 2003

    Growth and characterization of 850nm InGaAsP/InGaP strain-compensated VCSELs by MOCVD

    Kuo, H. C. / Lu, T. C. / Chang, Y. S. et al. | British Library Conference Proceedings | 2003

    Enhancement of proton-implanted GaAs VCSEL performance by transparent overcoating

    Lai, F.-I. / Laih, L. H. / Chang, Y. S. et al. | British Library Conference Proceedings | 2003

    Performances and reliability of 850nm VCSELs with various offset in gain peak and Fabry-Perot dip

    Lai, F.-I. / Laih, L.-H. / Hsueh, T. H. et al. | British Library Conference Proceedings | 2003