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Long term reliability testing of HV-IGBT modules in worst case traction operation
Microelectronics for space applications - challenges and opportunities
New on-chip screening of gate oxides smart power devices for automotive applications
Nichts geht mehr ohne. Elektronik im Kraftfahrzeug
On-chip reliability investigations on power modules actually working in inverter systems
Power semiconductor devices - development trends and system interactions
Preparing for Increased Electrostatic Discharge Device Sensitivity
Reliability aspects of semiconductor devices in high temperature applications
Reliability assurance for optical semiconductor devices
Reliability engineering-an integrated approach at Daimler Chrysler
Reliability of thick Al wire bonds in IGBT modules for traction motor drives