Synonyme wurden verwendet für: Electronics Failure
Suche ohne Synonyme: keywords:(Failure(Electronics))

1–20 von 123 Ergebnissen
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    Spontaneous Transistor Failures in Automotive Power Electronics

    Kiep, Andreas / Puerschel, Marco | SAE Technical Papers | 2014
    Schlagwörter: Power electronics , Failure modes and effects analysis

    Experimental verification and comparison of different tailoring models for spacecraft electronics thermal cycling tests

    Ji, Xin-Yan / Liu, Guo-Qing / Wang, Jing et al. | Elsevier | 2019
    Schlagwörter: Space vehicle electronics , Fatigue failure

    NASA GSFC EEE Parts: DPA and FA Summary

    Lyudmyla Panashchenko Ochs | NTRS | 2021
    Schlagwörter: Electrical Electronics Electromechanical (EEE) , Failure Analysis (FA) , Electronics And Electrical Engineering

    Lifetime Modeling for Silicon Carbide Based Power Module

    Sitta, Alessandro / Messina PhD, Angelo / Calabretta PhD, Michele | SAE Technical Papers | 2021
    Schlagwörter: Failure analysis , Power electronics , Failure modes and effects analysis

    NASA GSFC EEE Parts: DPA and FA Summary

    L. P. Ochs | NTIS | 2021
    Schlagwörter: Electrical electronics electromechanical (eee) , Failure analysis (fa)

    Designing electronics for high vibration and shock

    Markstein, H.W. | Tema Archiv | 1987
    Schlagwörter: ELEKTRONIK , AUSFALL , MECHANISCHER AUSFALL , ELECTRONIC SYSTEM

    NASA GSFC EEE Parts Failure Analysis: Isolating Integrated Circuit Electrical Damage

    Eric Galloway | NTRS | 2024
    Schlagwörter: failure analysis , Electronics and Electrical Engineering

    Workshop H: Building Reliable Circuit Board Assemblies - The Lessons Learned

    Bhanu Sood | NTRS
    Schlagwörter: Physics of Failure , Electronics Packaging

    Towards Dual and Three-Channel Electrical Architecture Design for More-Electric Engines

    Burt, Graeme / Sztykiel, Michal / Norman, Patrick et al. | SAE Technical Papers | 2018
    Schlagwörter: Power electronics , Failure modes and effects analysis

    Effect of Initial Assembly Gaps on Thread Strip and Fatigue Assessment of Bolted Joint

    Verma, Avinash / Singh, Punit / Shaikh, Rahil et al. | SAE Technical Papers | 2022
    Schlagwörter: Failure analysis , Power electronics

    Spannungsspitzen und -einbrueche gefaehrden Elektronik

    Kronenberg, H. | Tema Archiv | 1983
    Schlagwörter: ELEKTRONIK , AUSFALL

    Physics of Failure Approaches to Assessing Impacts of Assembly Level Rework Maintenance

    Sood, Bhanu | NTRS | 2019
    Schlagwörter: Physics of Failure , Electronics And Electrical Engineering

    Design guidelines for avionic corrosion prevention and control

    Carrato, A.F. / DeLong, G.E. / Shaffar, I.S. | Tema Archiv | 1981
    Schlagwörter: ELEKTRONIK , AUSFALL

    System Wide Reliability Impact of Power Converters in More-Electric Aircraft Applications

    Burt, Graeme M. / Fong, Kenny / Millar, Kieran et al. | SAE Technical Papers | 2023
    Schlagwörter: Failure analysis , Power electronics

    Duty Cycle Considerations for Electrohydrostatic Actuators

    SAE Technical Papers | 2018
    Schlagwörter: Power electronics , Failure modes and effects analysis

    Reliability Testing and Damage Analysis of Lead-Free Solder Joints: New Assessment Criteria for Laboratory Methods

    Steller, Antje / Zimmermann, Axel / Wolter, Klaus-Juergen et al. | SAE Technical Papers | 2009
    Schlagwörter: Consumer electronics , Failure modes and effects analysis

    Lightning effect on aircraft electronics

    Anderson, R.V. | Tema Archiv | 1984
    Schlagwörter: ELEKTRONIK , AUSFALL

    Impact of High Voltage on Wiring

    SAE Technical Papers | 2021
    Schlagwörter: Power electronics , Failure modes and effects analysis

    Comparison of reliability and economic feasibility for the three configurations of multiple battery charging systems

    Freier Zugriff
    Sung‐Jun Park / Yun‐Gi Kwak / Sung‐Geun Song et al. | DOAJ | 2023
    Schlagwörter: failure analysis , power electronics

    Trade Study for the Orbiting Technology Testbed Initiative to Support Code Y

    Frederickson, A. / Arens, W. / Garrett, H. et al. | NTRS | 1999
    Schlagwörter: radiation effects spacecraft electronics optics circuits reliability failure