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    THz Emission from Mercury Cadmium Telluride Films Grown on Cadmium Zinc Telluride Substrates

    THz Emission from Mercury Cadmium Telluride Films Grown on Cadmium Zinc Telluride Substrates


    We have observed THz emission from single- and double-layer HgCdTe (MCT) films epitaxially grown on CdZnTe substrates photoexcited by femtosecond laser pulses. The emitted THz radiation was electro-optically detected in reflection-mode at the 45° specular direction. There is a dramatic variation in the emitted signal level from the double-layer samples, whereas the signal level from the single-layer samples shows a relatively constant variation with composition and/or geometry. For the double-layer samples, the highest peak amplitude recorded is 1/5 of that of an InAs emitter, analogous to double that of a standard ZnTe emitter, and shows promise for further enhancement.

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    Titel :

    THz Emission from Mercury Cadmium Telluride Films Grown on Cadmium Zinc Telluride Substrates

    Beteiligte:
    Mendis, R. (Autor:in) / Smith, M. L. (Autor:in) / Vickers, R. E. M. (Autor:in) / Lewis, R. A. (Autor:in) / Zhang, C. (Autor:in)
    Erschienen in:

    2006 Joint 31st International Conference on Infrared Millimeter Waves and 14th International Conference on Teraherz Electronics ; 434

    Erscheinungsdatum :

    2006-09-01

    Format / Umfang :

    977535 byte

    ISBN :

    1-4244-0400-2 , 1-4244-0399-5

    DOI :

    https://doi.org/10.1109/ICIMW.2006.368642

    Medientyp :

    Aufsatz (Konferenz)

    Format :

    Elektronische Ressource

    Sprache :

    Englisch

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