Windowed fringe pattern analysis

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Windowed fringe pattern analysis

Kemao, Qian / Society of Photo-optical Instrumentation Engineers

Fringe patterns can be formed coherently using various interferometers and incoherently using the moirâe technique. They can also be designed in fringe projection profilometry. All of these techniques are useful for full-field, noncontact, and high-sensitivity measurement. The primary goal of fringe pattern analysis is to extract the hidden phase distributions that generally relate to the physical quantities being measured. This book addresses the challenges and solutions involved in this process. Both theoretical analysis and algorithm development will be covered to facilitate the work of both researchers and engineers. The information herein may also serve as a specialized subject for students of optical and/or computer engineering

Preface -- Glossary of terms and acronyms -- 1. Introduction -- 2. Windowed Fourier ridges for exponential phase fields -- 3. Windowed Fourier filtering for exponential phase fields -- 4. Quality-guided phase unwrapping and refinement -- 5. Carrier fringe pattern demodulation -- 6. Denoising a single closed fringe pattern -- 7. Demodulating a single closed fringe pattern -- 8. Extracting dynamic phase from a sequence of fringe patterns -- 9. Algorithm acceleration using parallel computing

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Dokumentinformationen

Titel :

Windowed fringe pattern analysis

Beteiligte:

Kemao, Qian (Autor:in) / Society of Photo-optical Instrumentation Engineers (Verlag)

Erschienen in:

SPIE Press monograph ; PM239

Erscheinungsdatum :

2013

Format / Umfang :

1 online resource (284 pages)

Anmerkungen:

illustrations
Campusweiter Zugriff (Universität Hannover) - Vervielfältigungen (z.B. Kopien, Downloads) sind nur von einzelnen Kapiteln oder Seiten und nur zum eigenen wissenschaftlichen Gebrauch erlaubt. Keine Weitergabe an Dritte. Kein systematisches Downloaden durch Robots.
"SPIE Digital Library."--Website. - Includes bibliographical references. - Title from PDF title page (SPIE eBooks Website, viewed 2013-07-12)
Includes bibliographical references
Restricted to subscribers or individual electronic text purchasers

ISBN :

9780819496430 , 9780819496416

DOI :

https://doi.org/10.1117/3.1002080

Medientyp :

Buch

Format :

Elektronische Ressource

Sprache :

Englisch

Schlagwörter :

Image analysis , Optical measurements , Electronic books