Titel :

Thermal analysis on internal and surface flaws by means of an infrared radiometer

Beteiligte:

Okamoto, Y. (Autor:in) / Kamoi, A. (Autor:in) / Ishii, T. (Autor:in) / Balageas, D. / Busse, G. / Carlomagno, G. M. / Technical University of Lodz / Polish Committee of Optoelectronics

Kongress:

Conference; 4th, Quantitative infrared thermography ; 1998 ; Lodz, Poland

Quantitative infrared thermography ; 71-76

EUROTHERM SEMINAR

Erscheinungsdatum :

1998-01-01

Format / Umfang :

6 pages

Anmerkungen:

Held in the frame of the Eurotherm seminars. Also known as QIRT'98

ISBN :

8387202886

Medientyp :

Aufsatz (Konferenz)

Format :

Print

Sprache :

Englisch

Schlagwörter :

quantitative infrared thermography , QIRT , Eurotherm , infrared thermography , thermography , optoelectronics , electronics

© Metadata Copyright the British Library Board and other contributors. All rights reserved.