Precise measurement of nonoptical surfaces by an oblique incidence interferometer [3478-20]
Conference; 9th, Laser interferometry: applications ; 1998 ; San Diego; CA
1998-01-01
4 pages
Aufsatz (Konferenz)
Englisch
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DataCite | 1912
Direct group-delay measurement and 3D profilometry using a white-light interferometer [3478-06]
British Library Conference Proceedings | 1998
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|Fourier transform moire deflectometry [3478-42]
British Library Conference Proceedings | 1998
|Sinusoidal wavelength-scanning interferometers [3478-04]
British Library Conference Proceedings | 1998
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