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Halbleiterbauelement
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Long term reliability testing of HV-IGBT modules in worst case traction operation
Fabrication, packaging, and performance of VCSELs and photodetectors for space applications
The past, present and future of EEE components for space application; COTS-the next generation
Reliability assurance for optical semiconductor devices
The effects of cyclic thermal loading on n-type 4H-SiC device components for EM-gun pulsers