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Zuverlaessigkeit am Beispiel der Flugzeugelektronik
Ueber die Alterung von Silizium-Leistungstromrichtern
The VMOS power device - A direct interface between microprocessors
The past, present and future of EEE components for space application; COTS-the next generation
The effects of cyclic thermal loading on n-type 4H-SiC device components for EM-gun pulsers
The easy way to get aerospace quality semiconductors
Technologies and reliability of modern embedded flash cells
Strain depending reliability of automotive diodes
Semiconductors in high temperature applications - a future trend in automotive industry
Reliable power electronics for automotive applications
Reliability of thick Al wire bonds in IGBT modules for traction motor drives
Reliability engineering-an integrated approach at Daimler Chrysler
Reliability assurance for optical semiconductor devices
Reliability aspects of semiconductor devices in high temperature applications