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Technologies and reliability of modern embedded flash cells
The easy way to get aerospace quality semiconductors
A lightweight 8-14 micrometer thermal imager
Reliability engineering-an integrated approach at Daimler Chrysler
Definition of driver information instrumentation feature
In situ Defect-screening of Integrated LDMOS for Critical Automotive Applications
Semiconductors in high temperature applications - a future trend in automotive industry
Preparing for Increased Electrostatic Discharge Device Sensitivity
Microelectronics for space applications - challenges and opportunities
A R-evolution in power electronics: from "intelligent" to "super smart power" in automotive
Reliability of thick Al wire bonds in IGBT modules for traction motor drives
Reliability aspects of semiconductor devices in high temperature applications
The VMOS power device - A direct interface between microprocessors
Strain depending reliability of automotive diodes