1–10 von 69 Ergebnissen
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    A complete methodology for assessing GaN behaviour for military applications

    Moreau, C. / Le Pipec, M. / Tence, S. et al. | Tema Archiv | 2010
    Schlagwörter: Transmissionselektronenmikroskopie

    Ageing and toughness of silicon carbide particulate reinforced Al-Cu and Al-Cu-Mg based metal-matrix composites

    Shakesheff, A.J. | Tema Archiv | 1995
    Schlagwörter: Transmissionselektronenmikroskopie

    Ageing behaviour and toughness of silicon carbide particulate reinforced Al-Li-Cu-Mg-Zr metal matrix composites

    Shakesheff, A.J. | Tema Archiv | 1995
    Schlagwörter: Transmissionselektronenmikroskopie

    A sol-gel based magneto-optical device for the NANOSAT space mission

    Zayat, M. / Pardo, R. / Rosa, G. et al. | Tema Archiv | 2009
    Schlagwörter: Transmissionselektronenmikroskopie

    Atomic oxygen resistant inorganic materials for LEO applications

    Poire, E. / Lachance, J. | Tema Archiv | 1999
    Schlagwörter: Transmissionselektronenmikroskopie

    Carbonaceous deposit formation in inconel 600 from thermal decomposition of N-dodecane, toluene and methylcyclohexane

    Altin, O. / Pradhan, B.K. / Eser, S. | Tema Archiv | 2000
    Schlagwörter: Transmissionselektronenmikroskopie

    Cementite dissolution and delamination of hyper-eutectoid pearlitic steel filaments for tire cords

    Yang, Y.S. / Park, S.Y. / Bae, J.G. et al. | Tema Archiv | 2007
    Schlagwörter: Transmissionselektronenmikroskopie

    Corrosion and control of P110 oil tube steel in CO2-saturated solution

    Zhao, J.M. / Lu, Y. / Liu, H.X. | Tema Archiv | 2008
    Schlagwörter: Transmissionselektronenmikroskopie

    Crystal orientation analysis of serviced rail with rolling contact fatigue damage

    Satoh, Y. / Iwafuchi, K. | Tema Archiv | 2003
    Schlagwörter: TEM (Transmissionselektronenmikroskopie)

    Development of Cu-bearing bake-hardenable steel sheets for automotive exposed panels

    Hong, Moon-Hi / Cho, Noi-Ha / Kim, Sung-Il et al. | Tema Archiv | 2010
    Schlagwörter: TEM (Transmissionselektronenmikroskopie)