1–13 von 13 Ergebnissen
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    Nanometer Displacement Measurement Using High Magnification Diffraction Imaging

    Chen, F. / Yang, L. X. / Harwood, P. | SAE Technical Papers | 2005

    2005-01-0587 Experimental Techniques for Strain Measurement and Validation of CAE Model

    Housari, B. / Yang, L. X. / Society of Automotive Engineers | British Library Conference Proceedings | 2005

    Vibration analysis and nondestructive testing by digital shearography [2861-07]

    Steinchen, W. / Yang, L. / Kupfer, G. et al. | British Library Conference Proceedings | 1996

    Digital shearography for pure in-plane strain measurement on the object surface under three-dimensional strain conditions [2860-20]

    Yang, L. / Steinchen, W. / Kupfer, G. et al. | British Library Conference Proceedings | 1996

    2005-01-0898 Nanometer Displacement Measurement Using High Magnification Diffraction Imaging

    Chen, F. / Harwood, P. / Yang, L. X. et al. | British Library Conference Proceedings | 2005

    Developmental steps for double-pulse shearography [3478-34]

    Steinchen, W. / Yang, L. / Kupfer, G. et al. | British Library Conference Proceedings | 1998

    Digital shearography for strain measurement: an analysis of measuring errors [3479-07]

    Steinchen, W. / Yang, L. / Maeckel, G. et al. | British Library Conference Proceedings | 1998

    Parallelism Measurement of Press Line during a Stamping Process Using High Speed Digital Image Correlation

    Yang, L. X. / Samala, P. R. / Kariat, S. et al. | SAE Technical Papers | 2008

    Surface Modification of AZ91 Magnesium Alloy

    Luan, B. L. / Gray, J. / Yang, L. X. et al. | British Library Conference Proceedings | 2007

    Out-of-plane and in-plane strain measured by shearography [2509-12]

    Steinchen, W. / Schuth, M. / Yang, L. X. et al. | British Library Conference Proceedings | 1995

    TV-Shearography for Applications in Industry

    Steinchen, W. / Yang, L. X. / Schuth, M. et al. | British Library Conference Proceedings | 1994

    Electronic speckle pattern shearing interferometry (ESPSI) and its application [2321-215]

    Steinchen, W. / Yang, L. X. / Schuth, M. et al. | British Library Conference Proceedings | 1994