1–12 von 12 Ergebnissen
|

Ihre Suche:
keywords:(electronics reliability)

    Electronics under the hood

    Stern, M. | Tema Archiv | 1985
    Schlagwörter: CIRCUIT RELIABILITY , ELECTRONICS SYSTEMS

    Maintaining shipboard electronics: onboard electronics still lack auto-test, but modernization is on the way

    Luke, L.P. | Tema Archiv | 1989
    Schlagwörter: MARINE SYSTEMS RELIABILITY , SHIPBOARD ELECTRONICS

    Recent trends in parts SEU susceptibility from heavy ions

    Nichols, D.K. / Smith, L.S. / Price, W.E. et al. | Tema Archiv | 1987
    Schlagwörter: CIRCUIT RELIABILITY , RADIATION HARDENING (ELECTRONICS)

    Decade 90: the future of system design. V. Fault-tolerant design spans terrestrial and space applications

    Leibson, S.H. | Tema Archiv | 1988
    Schlagwörter: RADIATION HARDENING (ELECTRONICS) , UTMOST IN RELIABILITY , STRINGENT RELIABILITY REQUIREMENTS

    High-temperature silicon-on-insulator electronics for space nuclear power systems: requirements and feasibility

    Fleetwood, D.M. / Thome, F.V. / Tsao, S.S. et al. | Tema Archiv | 1988
    Schlagwörter: CIRCUIT RELIABILITY , RADIATION HARDENING (ELECTRONICS) , SILICON-ON-INSULATOR ELECTRONICS

    SEU sensitivity of power converters with MOSFETs in space

    Brucker, G.J. / Measel, P. / Oberg, P. et al. | Tema Archiv | 1987
    Schlagwörter: CIRCUIT RELIABILITY , RADIATION HARDENING (ELECTRONICS) , HIGH-RELIABILITY FLIGHT PARTS

    Built-in test strategies for military systems

    Merlino, D.H. / Hadjilogiou, J. | Tema Archiv | 1989
    Schlagwörter: RELIABILITY MODELS , DEVICE ELECTRONICS

    Mechanical engineering issues and electronic equipment reliability: incurred costs without compensating benefits

    Leonard, C.T. | Tema Archiv | 1990
    Schlagwörter: INFLUENCE OF TEMPERATURE ON RELIABILITY , ELECTRONIC EQUIPMENT RELIABILITY , DENSE ELECTRONICS PACKAGING

    Effectiveness of CMOS charge reflection barriers in space radiation environments

    McNulty, P.J. / Lynch, J.E. / Abdel-Kader, W.G. | Tema Archiv | 1987
    Schlagwörter: CIRCUIT RELIABILITY , RADIATION HARDENING (ELECTRONICS)

    Advantage of advanced CMOS over advanced TTL in a cosmic ray environment

    Sokol, J.H. / Kolasinski, W.A. / Wong, M. et al. | Tema Archiv | 1987
    Schlagwörter: CIRCUIT RELIABILITY , RADIATION HARDENING (ELECTRONICS)

    Prediction of dose to failure versus dose rate for a recessed oxide digital bipolar microcircuit

    Schiff, D. | Tema Archiv | 1987
    Schlagwörter: CIRCUIT RELIABILITY , RADIATION HARDENING (ELECTRONICS)

    Total-dose hardness assurance for low Earth orbit

    Maurer, R.H. / Suter, J.J. | Tema Archiv | 1987
    Schlagwörter: CIRCUIT RELIABILITY , RADIATION HARDENING (ELECTRONICS)