Synonyme wurden verwendet für: electronics reliability
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1–10 von 130 Ergebnissen
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    NASA Efforts in Utilizing Commercial-Off-The-Shelf (COTS) Electronics in Mission Systems

    P. Majewicz | NTIS | 2023
    Schlagwörter: Quality Control & Reliability , Commercial electronics

    The State of NEPP NASA Electronic Parts & Packaging Program

    Peter Majewicz / Susana Douglas / Shri Agarwal | NTRS | 2023
    Schlagwörter: Quality Assurance and Reliability , Electronics and Electrical Engineering

    Status of NEPP Model-Based Mission Assurance Efforts

    Rebekah Austin | NTRS | 2021
    Schlagwörter: Quality Assurance And Reliability , Electronics And Electrical Engineering

    Recent NEPP Program Accomplishments and Fiscal Year 2022 Plans

    Peter Majewicz / Jonny Pellish / Shri Agarwal | NTRS | 2021
    Schlagwörter: Quality Assurance And Reliability , Electronics And Electrical Engineering

    Technological Feasibility of a Full-Electric Aircraft Considering Weight, Volume, and Reliability Restrictions

    Bolvashenkov, Igor / Kammermann, Jörg / Rubinraut, Alexander et al. | Springer Verlag | 2021
    Schlagwörter: Reliability , Power Electronics, Electrical Machines and Networks

    Design and Feasibility of Electrical Version of Search-and-Rescue Helicopter Based on Eurocopter

    Bolvashenkov, Igor / Kammermann, Jörg / Rubinraut, Alexander et al. | Springer Verlag | 2021
    Schlagwörter: Reliability , Power Electronics, Electrical Machines and Networks

    Physics of Failure Approaches to Assessing Impacts of Assembly Level Rework Maintenance

    Sood, Bhanu | NTRS | 2019
    Schlagwörter: Quality Assurance And Reliability , Electronics And Electrical Engineering

    NASA Electronic Parts and Packaging (NEPP) Program: Overview and Technology Focus Areas - Responsive Technology Assurance for Civil Space

    Pellish, Jonathan A. / Majewicz, Peter J. / Sampson, Michael J. | NTRS | 2019
    Schlagwörter: reliability , Electronics And Electrical Engineering

    SAE ARP6338: Process for Assessment and Mitigation of Aging and Potential Early Wearout of Life-Limited Microcircuits (LLM)

    Alagappan, Ashok / Hillman, Craig / Condra, Lloyd | SAE Technical Papers | 2019
    Schlagwörter: Consumer electronics , Reliability

    Architecture and Composition of ATC Automation System Simulators for Controllers

    Bestugin A.R. / Eshenko A.A. / Filin A.D. et al. | Springer Verlag | 2019
    Schlagwörter: Quality Control, Reliability, Safety and Risk , Electronics and Microelectronics, Instrumentation