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Engineering
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Optical Engineering
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journal:(Optical Engineering)
EZ-scan: single-beam measurement technique for thin-film nonlinearities [2229-17]
All-optical switching using second-order nonlinearities in KTP [2229-22]
Schwarzschild microscope at the wavelength of 18 nm using a laser-produced plasma source [2515-61]
Measurement approach for photodevice impedance [2893-586]
Transition mode in core-radius decreasing fiber and effect on soliton propagation [2893-599]
High-power GRIN-SCH lasers with low-threshold-current density and high efficiency [2886-533]