Technologies and reliability of modern embedded flash cells
The easy way to get aerospace quality semiconductors
A lightweight 8-14 micrometer thermal imager
Reliability engineering-an integrated approach at Daimler Chrysler
Definition of driver information instrumentation feature
In situ Defect-screening of Integrated LDMOS for Critical Automotive Applications
Semiconductors in high temperature applications - a future trend in automotive industry
Preparing for Increased Electrostatic Discharge Device Sensitivity
Microelectronics for space applications - challenges and opportunities
A R-evolution in power electronics: from "intelligent" to "super smart power" in automotive
Reliability of thick Al wire bonds in IGBT modules for traction motor drives
The VMOS power device - A direct interface between microprocessors
Reliability aspects of semiconductor devices in high temperature applications
Strain depending reliability of automotive diodes