Electronic speckle pattern shearing interferometry (ESPSI) and its application [2321-215]
Out-of-plane and in-plane strain measured by shearography [2509-12]
Vibration analysis and nondestructive testing by digital shearography [2861-07]
Developmental steps for double-pulse shearography [3478-34]
Digital shearography for strain measurement: an analysis of measuring errors [3479-07]
Non-destructive testing of aerospace composite materials using digital shearography
Nanometer Displacement Measurement Using High Magnification Diffraction Imaging
2005-01-0587 Experimental Techniques for Strain Measurement and Validation of CAE Model
2005-01-0898 Nanometer Displacement Measurement Using High Magnification Diffraction Imaging