Synonyme wurden verwendet für: electronics reliability
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1–44 von 44 Ergebnissen
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    Challenges with Electrical, Electronics, and Electromechanical Parts for James Webb Space Telescope

    Jah, Muzar A. / Jeffers, Basil S. | NTRS | 2016
    Schlagwörter: Electronics , Reliability , Electronics And Electrical Engineering

    Management von SW-Zuverlässigkeit in der Produktentwicklung: ein Erfahrungsbericht

    Dold, Axel | Tema Archiv | 2007
    Schlagwörter: Software-Zuverlässigkeit , eingebettete Elektronik

    Robustness validation for automotive products

    Preussger, Andreas | Tema Archiv | 2008
    Schlagwörter: Kfz-Elektronik , Zuverlässigkeit integrierter Schaltungen

    Probabilistische Methode zur Generierung von Stimuli zum Test zustandsbasierter, reaktiver Elektroniksysteme im Automobil

    Diegmüller, Frank | Tema Archiv | 2009
    Schlagwörter: Kfz-Elektronik , Zuverlässigkeit integrierter Schaltungen

    Compendium of Radiation Effects Test Results from NASA Goddard Space Flight Center

    A. D. Topper / M. C. Casey / E. P. Wilcox et al. | NTIS | 2022
    Schlagwörter: Space radiation reliability , Spacecraft electronics

      Compendium of Radiation Effects Test Results from NASA Goddard Space Flight Center

      A. D. Topper / M. C. Casey / E. P. Wilcox et al. | NTIS | 2021
      Schlagwörter: Spacecraft electronics , Space radiation reliability

    Funktionaler Softwaretest für aktive Fahrerassistenzsysteme mittels parametrierter Szenario-Simulation

    Schmidt, Florian / Sax, Eric | Tema Archiv | 2009
    Schlagwörter: eingebettete Elektronik , Software-Zuverlässigkeit

    The State of NEPP NASA Electronic Parts & Packaging Program

    Peter Majewicz / Susana Douglas / Shri Agarwal | NTRS | 2023
    Schlagwörter: Quality Assurance and Reliability , Electronics and Electrical Engineering

    KRAFAS - Einbetttechnologien für aktive Komponenten

    Kostelnik, Jan / Becker, Karl-Friedrich / Ebling, Frank et al. | Tema Archiv | 2008
    Schlagwörter: eingebettete Elektronik , Zuverlässigkeit

    Reliability evaluation of lead-free solders for automotive applications

    Sa, Y.K. / Kim, Yeong K. / Bang, Junghwan et al. | Tema Archiv | 2009
    Schlagwörter: Kfz-Elektronik , Zuverlässigkeit integrierter Schaltungen

    Effect of vibration on lead-free solder joint reliability under temperature changes for automotive electronics

    Yoo, Sehoon / Sa, Y.K. / Kim, Yeong K. et al. | Tema Archiv | 2009
    Schlagwörter: Kfz-Elektronik , Zuverlässigkeit integrierter Schaltungen

    A real-time simulator for electronic chassis control systems

    Eto, Y. / Endo, N. / Watanabe, K. | Tema Archiv | 1995
    Schlagwörter: Elektronik , Zuverlässigkeit

    Batteriesensorik und Batteriezustandserkennung

    Frey, Bernd / Häffner, Jürgen / Merkle, Michael et al. | Tema Archiv | 2004
    Schlagwörter: Zuverlässigkeit , Elektronik

    Compendium of Single Event Effect Results from NASA Goddard Space Flight Center

    O'Bryan, Martha V. / LaBel, Kenneth A. / Szabo, Carl M. et al. | NTRS | 2016
    Schlagwörter: space radiation reliability , spacecraft electronics , Electronics And Electrical Engineering

    Modifying spaceborne computer drives for conduction cooling

    Moran, M.E. | Tema Archiv | 1997
    Schlagwörter: Zuverlässigkeit , Elektronik

    Accelerated design and implementation of an adaptive CVT controller using hardware-in-the-loop prototyping techniques

    Cervone, C. / Gallinaro, E. / Pagliarulo, E. et al. | Tema Archiv | 2000
    Schlagwörter: Elektronik , Zuverlässigkeit

    Condition based monitoring

    Hocking, J. | Tema Archiv | 1995
    Schlagwörter: Zuverlässigkeit , Elektronik

    Comparing substrate solutions for automotive power electronics applications

    Fairchild, M.R. / Myers, J.D. / Badgett, J.L. et al. | Tema Archiv | 2004
    Schlagwörter: Kfz-Elektronik , Zuverlässigkeit von Bauelementen

    Development of electric machine duty cycles for parallel hybrid electric Beijing city bus based on Markov chain

    Li, Wen / Lee, Tae-Kyung / Filipi, Zoran S. et al. | Tema Archiv | 2012
    Schlagwörter: Anwendung in der Elektrotechnik und Elektronik , Zuverlässigkeit

    High-temperature resistant devices for energy-efficient automotive applications

    Treichel, H. / Seitz, S. / Neumeier, K. et al. | Tema Archiv | 1997
    Schlagwörter: Zuverlässigkeit , Elektronik

    Bipolar phototransistors reliability assessment for space applications

    Gilard, O. / Quadri, G. / Spezzigu, P. et al. | Tema Archiv | 2007
    Schlagwörter: Zuverlässigkeit , Härten von Elektronik gegen Strahlung

    Semi-automatic reliability assessment of safety related embedded systems

    Kucera, Markus / Mauser, Hans | Tema Archiv | 2006
    Schlagwörter: Zuverlässigkeit , Kfz-Elektronik

    Hydraulische Systeme in modernen zivilen Transportflugzeugen

    Besing, W. | Tema Archiv | 1993
    Schlagwörter: Zuverlässigkeit , Elektronik

    Initial Test Sequence, SFD-222AH Crossed Field Amplifier

    NTIS | 1972
    Schlagwörter: Reliability(Electronics)

    Enhancement of GPRS surveillance system into real time control

    Lin, C.E. / Hsu, C.W. / Li, Y.S. | Tema Archiv | 2005
    Schlagwörter: eingebettete Elektronik , Zuverlässigkeit

    Evaluation of an Image Intensifier System for Use on Tracking Telescopes

    C. R. Hayslett | NTIS | 1972
    Schlagwörter: Image intensifiers(Electronics) , Reliability(Electronics)

    Development of a Zero-G Gauging System. Volume I

    F. E. Bupp | NTIS | 1974
    Schlagwörter: Reliability(Electronics)

    VHF and UHF High-G Telemetry Instrumentation for Harp Vehicles

    W. H. Mermagen / W. J. Cruickshank / F. Vrataric | NTIS | 1966
    Schlagwörter: Reliability(Electronics)

    Qualification Test Report RF Detectors Model AGM-45A-3 Guided Missile

    J. C. Applegate | NTIS | 1966
    Schlagwörter: Reliability(Electronics)

    High Temperature Infrared Detectors for Aircraft Fire Detection

    G. Entine / C. R. Mitchell / F. V. Wald et al. | NTIS | 1971
    Schlagwörter: Reliability(Electronics)

    Flight demonstration results of UV protected dichroic displays compared to laboratory results

    Doyle, J.J. jun. / Wisler, K. / Giuglianotti, M. | Tema Archiv | 1997
    Schlagwörter: Zuverlässigkeit , Härten von Elektronik gegen Strahlung

    Recent trends in parts SEU susceptibility from heavy ions

    Nichols, D.K. / Smith, L.S. / Price, W.E. et al. | Tema Archiv | 1987
    Schlagwörter: CIRCUIT RELIABILITY , RADIATION HARDENING (ELECTRONICS)

    The far ultraviolet spectroscopic explorer (FUSE) instrument data system

    Heggestad, B.K. / Moore, R.C. | Tema Archiv | 1999
    Schlagwörter: Zuverlässigkeit , Härten von Elektronik gegen Strahlung

    SEU sensitivity of power converters with MOSFETs in space

    Brucker, G.J. / Measel, P. / Oberg, P. et al. | Tema Archiv | 1987
    Schlagwörter: CIRCUIT RELIABILITY , RADIATION HARDENING (ELECTRONICS) , HIGH-RELIABILITY FLIGHT PARTS

    Type Approval Test Report on Ferranti Solar Cells for the Black Arrow X3 Spacecraft

    A. A. Dollery | NTIS | 1969
    Schlagwörter: Reliability(Electronics)

    Small power systems for law enforcement applications

    Sims, P.E. / Mauk, M.G. / Sulima, O.V. | Tema Archiv | 2002
    Schlagwörter: Elektronik , Zuverlässigkeit

    The Optical Sensor and Tracker

    L. M. Bradley | NTIS | 1972
    Schlagwörter: Reliability , Reliability(Electronics)

    Research Study of Radar Reliability and its Impact on Life-Cycle Costs for the APQ-113, -114, -120 and -144 Radars

    S. G. Miller / R. T. Simpson / A. M. Agnone et al. | NTIS | 1973
    Schlagwörter: Quality Control & Reliability , Reliability(Electronics)

    Laser Weapon Fire Simulator Using Retroreflective Targets

    A. H. Marshall / G. A. Siragusa / H. C. Towle | NTIS | 1972
    Schlagwörter: Reliability(Electronics)

    Effectiveness of CMOS charge reflection barriers in space radiation environments

    McNulty, P.J. / Lynch, J.E. / Abdel-Kader, W.G. | Tema Archiv | 1987
    Schlagwörter: CIRCUIT RELIABILITY , RADIATION HARDENING (ELECTRONICS)

    Advantage of advanced CMOS over advanced TTL in a cosmic ray environment

    Sokol, J.H. / Kolasinski, W.A. / Wong, M. et al. | Tema Archiv | 1987
    Schlagwörter: CIRCUIT RELIABILITY , RADIATION HARDENING (ELECTRONICS)

    Prediction of dose to failure versus dose rate for a recessed oxide digital bipolar microcircuit

    Schiff, D. | Tema Archiv | 1987
    Schlagwörter: CIRCUIT RELIABILITY , RADIATION HARDENING (ELECTRONICS)

    Navy Flight Experiment of SECANT Transponder Correlation Ranging Equipment

    J. L. Hinds / M. G. Raditz / O. Shames | NTIS | 1972
    Schlagwörter: Reliability(Electronics)

    Investigation and Characterization of SEU Effects and Hardening Strategies in Avionics

    A. H. Taber / E. Normand | NTIS | 1995
    Schlagwörter: Reliability(Electronics)

    Total-dose hardness assurance for low Earth orbit

    Maurer, R.H. / Suter, J.J. | Tema Archiv | 1987
    Schlagwörter: CIRCUIT RELIABILITY , RADIATION HARDENING (ELECTRONICS)