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A Novel Cloud-Based Additive Manufacturing Technique for Semiconductor Chip Casings
IIoT-Enabled Production System for Composite Intensive Vehicle Manufacturing
The redesign of a warranty distribution network with recovery processes
Energietechnik im Wandel - Entwicklung der Bahnstromversorgung in Deutschland
Obtaining Diagnostic Coverage Metrics Using Rapid Prototyping of Multicore Systems
In situ Defect-screening of Integrated LDMOS for Critical Automotive Applications
Avoiding Electrical Overstress for Automotive Semiconductors by New Connecting Concepts
New on-chip screening of gate oxides smart power devices for automotive applications
A CMOS range camera based on single photon avalanche diode
Kalibriernormal für Geräte der registrierenden Härteprüfung
Microelectronics for space applications - challenges and opportunities
Power semiconductor devices - development trends and system interactions
Bipolar phototransistors reliability assessment for space applications
Technologies and reliability of modern embedded flash cells
Dicke Ströme durch dünne Röhrchen
Von der Hochfrequenztechnik zur Quantenelektronik
Methoden der interferometrischen Formerfassung nicht-ruhender technischer Oberflächen
Nanotechnologien dringen in die Elektronik
Semiconductors in high temperature applications - a future trend in automotive industry
A R-evolution in power electronics: from "intelligent" to "super smart power" in automotive
Detection of tin plating and tin whisker mitigation
Die verschlungenen Pfade einer Erfolgsgeschichte
Reliability aspects of semiconductor devices in high temperature applications
Reliable power electronics for automotive applications
Strom fließt bald aus dünnen Schichten
Schnell schalten und cool bleiben
Reliability of thick Al wire bonds in IGBT modules for traction motor drives
Acceptance checking methods for UHF electronic components
GaAs/AlGaAs-Quantenfilm-Photodetektoren für Kameras im 8...12 Mikrometer-Bereich
Leistungselektronik für den Megawattbereich
Reliability engineering-an integrated approach at Daimler Chrysler