Electronic reliability issues relative to automotive product
Power train control: a convergence of LSI-technologies
Neutron hardness assurance considerations for temperature compensated reference diodes
A transient hardened junction isolated bipolar technology
Multiprocessing for electronic warfare avionics
Neutron damage in PIN diode phase shifters for radar arrays
Interface threat analysis and current injection testing for direct drive SGEMP in multiwire cables
EASCON 79, electronics and aerospace systems conference, Artington, V.A., USA, October 9-11, 1979
Engineering problems and the trade offs in the design of high technology devices
A monolithic voltage regulator for automotive electronic systems