Virtual key life tests of instrument panels for product development

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Virtual key life tests of instrument panels for product development

Su, H. / Thyagarajan, R. / Brown, J.

Traditionally in the product development (PD) of instrument panel products, the design validation (DV) is mainly based on physical key life tests (KLT), as try to satisfy the product durability requirements. CAE virtual tests of instrument panels provide a way to speed up product development, to minimize prototype tests and to reduce development costs. In the present study a CAE procedure was developed to qualify instrument panel (IP) products under the vehicle key life test environments, by employing a set of CAE simulation and durability techniques. The virtual key life test method simulates the same structural configuration and the proving ground road loads as in the physical test. A representative dynamic road load profile model is constructed based on the vehicle proving ground field data. The dynamic stress simulation is realized by employing the finite element transient analysis. The durability evaluation is based on the dynamic stress results and the material fatigue properties of each component. Instrument panel examples are illustrated to highlight the practical applications and their benefits in the product development process. The CAE procedure has helped the IP engineering team to identify and correct potential durability problems at an earlier design stage, before a prototype is physically made and tested. The virtual test method is useful to analyze the insight relationship into the design parameters, component weak spots and product life, provide the guidance to design improvement, and achieve the goal for only one successful physical key life test.