Built-in test (BIT) provides fault finding as a means to aid in system assembly, test, and maintenance. An investigation to evaluate BIT of a particular electronics board used in the in-flight entertainment system for Boeing 777s is described. We found BIT proved useful when failure occurrences were uniquely associated with the operating environment, situations which can result in no-fault found, or could-not duplicate (CND) failures upon test. We also observed cases where the BIT failed to observe failures, and in some cases pointed to the wrong cause of failure. These and other advantages and disadvantages of BIT implementation are discussed.


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    Titel :

    Evaluation of built-in test


    Beteiligte:
    Pecht, M. (Autor:in) / Dube, M. (Autor:in) / Natishan, M. (Autor:in) / Williams, R. (Autor:in) / Banner, J. (Autor:in) / Knowles, I. (Autor:in)


    Erscheinungsdatum :

    2001


    Format / Umfang :

    6 Seiten, 24 Quellen




    Medientyp :

    Aufsatz (Zeitschrift)


    Format :

    Print


    Sprache :

    Englisch




    Evaluation of built-in test

    Pecht, M. / Dube, M. / Natishan, M. et al. | IEEE | 2001


    Common built-in-test evaluation criteria

    Westervelt, K. | IEEE | 2003


    PAPERS - Evaluation of Built-In Test

    Pecht, M. | Online Contents | 2001


    11.0303 Common Built-In-Test Evaluation Criteria

    Institute of Electrical and Electronics Engineers | British Library Conference Proceedings | 2003


    Built-in Test Maturation Concepts

    Sudolsky | Online Contents | 1996