Integrated circuit device changes and their effect on ATPG generated program sets

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Integrated circuit device changes and their effect on ATPG generated program sets

McCollor, R.L.

Integrated Circuit (IC) devices are the accepted means of fabricating electronic equipments. This is predominantly the case in avionics and military electronic equipments where the principal design objectives are to minimize the volume, weight and power consumption of the equipment. Much electronic testing, especially in the military, is now performed with automatic test equipments (ATE). Automatic test program generators (ATPG) are in extensive use for the generation of test program sets. This is the standard practice for digital circuitry testing where the Logic Automated Stimulus and Response (LASAR) and similar digital ATPGs have been used for many years. Much effort is now being expended on the development of analog ATPGs. The input to LASAR and similar digital ATPGs is a model of the IC internal circuitry in the form of NAND gates or other equally simple circuit functions and the IC interconnections. The ATPG generates appropriate stimulus patterns and response codes for the unit under test (UUT), usually a printed circuit card. In the case of improper or missing responses, the ATPG determines the most probable cause of failure. The ATPG generated test program is thus based on both the IC interconnections with other devices and the IC device internal architecture.