Optimization of Digital Twins in the Workshop

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Optimization of Digital Twins in the Workshop

Xu, Tao / Liu, Lilan / Chen, Chen / Guo, Kai / Yuan, Shibo / Miao, Qiang

For digital twin in current time, some applications have gradually matured. But there are still some unsatisfactory, such as t oversized production line models, The hardware requirements have also increased, so this article introduces the triangle folding algorithm to optimize the model, light-weight modelling of the digital twin model of the production line, complete the establishment of the digital model of the production line, and solves the problem that the entire virtual and real synchronous digital twin 3D model is too huge. There is also the problem of data collection and filtering in the production line. A large number of complex data makes the digital twin have requirements for the capacity and efficiency of the hardware. In order to reduce the load of data, Use multi-dimensional Bloom Filter algorithm technology to query the collected data set to reduce redundancy, complete the collection and filtering process, improve the accuracy of the data. Through the application of these two algorithms in practice, it shows the optimization of the digital twins in the workshop.

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Dokumentinformationen

Titel :

Optimization of Digital Twins in the Workshop

Weitere Titelangaben:

Lect. Notes Electrical Eng.

Beteiligte:

Wang, Yi (Herausgeber:in) / Martinsen, Kristian (Herausgeber:in) / Yu, Tao (Herausgeber:in) / Wang, Kesheng (Herausgeber:in) / Xu, Tao (Autor:in) / Liu, Lilan (Autor:in) / Chen, Chen (Autor:in) / Guo, Kai (Autor:in) / Yuan, Shibo (Autor:in) / Miao, Qiang (Autor:in)

Kongress:

International Workshop of Advanced Manufacturing and Automation ; 2020 ; Zhanjiang, China October 12, 2020 - October 13, 2020

Erschienen in:

Advanced Manufacturing and Automation X ; Kapitel : 33 ; 262-269

Lecture Notes in Electrical Engineering ; 737

Erscheinungsdatum :

2021-01-23

Format / Umfang :

8 pages

ISBN :

978-981-33-6318-2 , 978-981-33-6317-5

ISSN :