Dielectric loss measurements were performed on high purity semi-insulating SiC wafers of various grades. Analysis of experimental data would provide insight into the nature of loss mechanisms in this material and into its potential as an alternate material for gyrotron window applications. Experimental results will be presented.


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    Titel :

    Dielectric Losses in SiC at Millimeter Wavelengths


    Beteiligte:
    Dutta, J. M. (Autor:in) / Yu, Guofen (Autor:in) / Jones, C. R. (Autor:in)


    Erscheinungsdatum :

    2006-09-01


    Format / Umfang :

    1214092 byte




    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Elektronische Ressource


    Sprache :

    Englisch



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