Tomography of polaron luminescence in LiNbO/sub 3/: application to the characterisation of optical guides and integrated optical devices

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Tomography of polaron luminescence in LiNbO/sub 3/: application to the characterisation of optical guides and integrated optical devices

Guilbert, L. / Bourson, P. / Harira, A. / Salvestrini, J.P. / Zhang, Y. / Fontana, M.D.

We propose in this paper a fast, sensitive and reliable technique of characterisation based on micro-spectroscopy (Raman and polaron luminescence), which allows at the determination of the chemical reduction profile after titanium diffusion or other high-temperature annealing treatments, and thus to the electrical conductivity, in the section of the waveguides. This profile allows us to predict the DC drift of active components using the electro-optical effect. Moreover, coupled with confocal microscopy, this technique can give 2D and 3D maps of a waveguide at micro scale.

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Dokumentinformationen

Titel :

Tomography of polaron luminescence in LiNbO/sub 3/: application to the characterisation of optical guides and integrated optical devices

Beteiligte:

Guilbert, L. (Autor:in) / Bourson, P. (Autor:in) / Harira, A. (Autor:in) / Salvestrini, J.P. (Autor:in) / Zhang, Y. (Autor:in) / Fontana, M.D. (Autor:in)

Erschienen in:

CLEO/Europe. 2005 Conference on Lasers and Electro-Optics Europe, 2005. ; 446

Erscheinungsdatum :

2005-01-01

Format / Umfang :

231120 byte

ISBN :

0-7803-8974-3

DOI :

https://doi.org/10.1109/CLEOE.2005.1568224

Medientyp :

Aufsatz (Konferenz)