COMPONENT MONITORING BASED ON MAGNETIC SIGNALS
COMPONENT MONITORING BASED ON MAGNETIC SIGNALS
- Neue Suche nach: ZHANG LI
- Neue Suche nach: JOHANNSEN ERIC J
- Neue Suche nach: ZHANG LI
- Neue Suche nach: JOHANNSEN ERIC J
A system may include a first device and a second device. The first device may be configured to be associated with a component of a machine. The second device may be configured to provide one or more interrogation magnetic signals to the first device; and determine, based on providing the one or more interrogation magnetic signals, whether a response magnetic signal is received from the first device. The second device may selectively provide first wear information indicating a first amount of wear of the component or second wear information indicating a second amount of wear of the component. The first information may be provided when the response magnetic signal is received from the first device. The second wear information may be provided when the response magnetic signal is not received from the first device. The second amount of wear may exceed the first amount of wear.
Dokumentinformationen
COMPONENT MONITORING BASED ON MAGNETIC SIGNALS
2023-02-23
Patent
Elektronische Ressource
Englisch