The present apparatus is configured to carry an instrument or probe and optionally deploy it against a surface, such as a metal pipeline or storage tank. The apparatus can include a sensor probe for inspecting the integrity of the surface and a first linkage that is operatively coupled to the sensor probe and configured to move the sensor probe according to a first path (in a first direction/first degree of freedom). An actuator can be operatively connected to the first linkage for moving the first linkage so as to move the sensor probe along the first path. A second linkage is operatively connected to the sensor probe and configured to passively move the sensor probe according to a second degree of freedom to cause the sensor probe to become normal to the surface when at least a portion of the apparatus contacts the surface.


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    Titel :

    Deployment mechanism for passive normalization of a probe relative to a surface


    Beteiligte:
    CARRASCO ZANINI PABLO (Autor:in) / ABDELLATIF FADL (Autor:in) / PATEL SAHEJAD (Autor:in) / HIROSE SHIGEO (Autor:in) / GUARNIERI MICHELE (Autor:in) / DEBENEST PAULO (Autor:in)

    Erscheinungsdatum :

    2018-07-03


    Medientyp :

    Patent


    Format :

    Elektronische Ressource


    Sprache :

    Englisch


    Klassifikation :

    IPC:    G01N Untersuchen oder Analysieren von Stoffen durch Bestimmen ihrer chemischen oder physikalischen Eigenschaften , INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES / B62D MOTOR VEHICLES , Motorfahrzeuge



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