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    Titel :

    Shape measurement of BGA for analysis of defects by x-ray imaging [5253-74]


    Beteiligte:

    Kongress:

    International symposium; 5th, Instrumentation and control technology



    Erscheinungsdatum :

    2003-01-01


    Format / Umfang :

    5 pages




    Medientyp :

    Aufsatz (Konferenz)


    Format :

    Print


    Sprache :

    Englisch




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