Automated Quality Control for Micro-Technology Components Using a Depth from Focus Approach
Automated Quality Control for Micro-Technology Components Using a Depth from Focus Approach
- Neue Suche nach: Schaper, D.
- Neue Suche nach: IEEE Computer Society
- Neue Suche nach: IEEE Signal Processing Society
- Neue Suche nach: Schaper, D.
- Neue Suche nach: IEEE Computer Society
- Neue Suche nach: IEEE Signal Processing Society
Dokumentinformationen
Automated Quality Control for Micro-Technology Components Using a Depth from Focus Approach
Symposium; 5th, Image analysis and interpretation ; 2002 ; Santa Fe, NM
2002-01-01
7 pages
Also known as SSIAI 2002. IEEE order no. PR01537
Aufsatz (Konferenz)
Englisch
image analysis , IEEE , SSIAI
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
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