Aspheric surface fabrication in nanometer-level accuracy by numerically controlled plasma chemical vaporization machining (CVM) and elastic emission machining (EEM) [4782-35]
conference, X-ray mirrors crystals and multilayers ; 2002 ; Seattle, WA
2002-01-01
6 pages
Aufsatz (Konferenz)
Englisch
X-ray mirrors , SPIE , crystals , multilayers
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Topography measurement of nanometer synchrotron optics [4782-02]
British Library Conference Proceedings | 2002
|Software For Numerically Controlled Machining
NTRS | 1990
|DataCite | 1937
Portable Software For Numerically Controlled Machining
NTRS | 1994
|Portable Software for Numerically Controlled Machining
Online Contents | 1994