Titel :

New strategic challenges for instrumentation in precision laser metrology for industry [4420-11]

Beteiligte:

Chour, M. (Autor:in) / Muller, J. (Autor:in) / Hofmann, D. (Autor:in) / Albertazzi, A. / Society for Optical Engineering / IMEKO - The International Measurement Confederation / Metrologia - The Brazilian Society of Metrology

Kongress:

Technical conference, Laser metrology for precision measurement and inspection in industry ; 1999 ; Florianopolis, Brazil

Laser metrology for precision measurement and inspection in industry ; 99-106

PROCEEDINGS- SPIE THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING ; 4420

Erscheinungsdatum :

2001-01-01

Format / Umfang :

8 pages

ISBN :

0819441279

ISSN :

0277-786X

Medientyp :

Aufsatz (Konferenz)

Format :

Print

Sprache :

Englisch

Schlagwörter :

laser metrology , precision measurement , industry , IMEKO , SPIE , Metrologia

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