Hard x-ray characterization of a HEFT single-reflection prototype [4012-72]
Hard x-ray characterization of a HEFT single-reflection prototype [4012-72]
- Neue Suche nach: Christensen, F. E.
- Neue Suche nach: Craig, W. W.
- Neue Suche nach: Hailey, C. J.
- Neue Suche nach: Jimenez-Garate, M. A.
- Neue Suche nach: Windt, D. L.
- Neue Suche nach: Harrison, F. A.
- Neue Suche nach: Mao, P. H.
- Neue Suche nach: Ziegler, E.
- Neue Suche nach: Honkimaki, V.
- Neue Suche nach: Del Rio, M. S.
- Neue Suche nach: International Society for Optical Engineering
- Neue Suche nach: Christensen, F. E.
- Neue Suche nach: Craig, W. W.
- Neue Suche nach: Hailey, C. J.
- Neue Suche nach: Jimenez-Garate, M. A.
- Neue Suche nach: Windt, D. L.
- Neue Suche nach: Harrison, F. A.
- Neue Suche nach: Mao, P. H.
- Neue Suche nach: Ziegler, E.
- Neue Suche nach: Honkimaki, V.
- Neue Suche nach: Del Rio, M. S.
- Neue Suche nach: Trumper, J. E.
- Neue Suche nach: Aschenbach, B.
- Neue Suche nach: International Society for Optical Engineering
Dokumentinformationen
Hard x-ray characterization of a HEFT single-reflection prototype [4012-72]
Conference; 3rd, X-ray optics, instruments, and missions ; 2000 ; Munich, Germany
2000-01-01
13 pages
Aufsatz (Konferenz)
Englisch
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