Titel :

Understanding infrared clutter through fixation point analysis (Invited Paper) [2223-10]

Beteiligte:

Rotman, S. R. (Autor:in) / Kowalczyk, M. L. (Autor:in) / Cartier, J. (Autor:in) / Chang, J. (Autor:in) / Watkins, W. R. / Clement, D. / SPIE

Kongress:

Conference, Characterization and propagation of sources and backgrounds ; 1994 ; Orlando; FL

Characterization and propagation of sources and backgrounds ; 2223 ; 126-138

PROCEEDINGS- SPIE THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING ; 2223

Erscheinungsdatum :

1994-01-01

Format / Umfang :

13 pages

Anmerkungen:

Held as part of the Atmospheric Imaging Program in SPIE's International symposium on optical engineering in aerospace sensing

ISBN :

0819415278

ISSN :

0361-0748

Medientyp :

Aufsatz (Konferenz)

Format :

Print

Sprache :

Englisch

Schlagwörter :

propagation , backgrounds , aerospace sensing , atmospheric imaging , SPIE

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